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发明公开
CN107918075A 一种适用于电子设备的嵌入式测试单元装置及方法 无效 - 驳回

一种适用于电子设备的嵌入式测试单元装置及方法
摘要：
本发明公开了一种适用于电子设备的嵌入式测试单元装置及方法，包括标准数字BIT芯片、标准模拟BIT芯片及射频微波标准BIT芯片；标准模拟BIT芯片和所述射频微波标准BIT芯片采集的信号都传送到所述标准数字BIT芯片，所述标准数字BIT芯片通过各种接口与上位机通信实现功能控制和信息的采集。本发明标准BIT芯片设计满足嵌入式测试单元的硬件需求，组合式设计和测试性匹配优化算法通过软件实现满足嵌入式测试性单元设计的软件需求。通过硬软件的结合辅助设计人员实现电子设备功能与BIT的一体化设计，满足各类测试性要求。
摘要（英）：

The invention discloses an embedded test unit device and method suitable for electronic equipment; the embedded test unit device comprises a standard digital BIT chip, a standard simulation BIT chip,and a radio frequency microwave standard BIT chip; the signals gathered by the standard simulation BIT chip and the radio frequency microwave standard BIT chip are transmitted to the standard digitalBIT chip; the standard digital BIT chip and a host computer can realize function control and information acquisition through various interfaces. The standard digital BIT chip is designed to satisfy hardware demands of the embedded test unit; a combined design and a testability coupling optimization algorithm can satisfy the software demands of the embedded test unit design through the software. The hardware and software are combined to assist design personnel to integrate the electronic equipment functions with the BIT, thus satisfying various testability demands.

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