Inspection devices and inspection method are disclosed. The inspection method includes: performing X-ray scanning on an object being inspected so as to generate an image of the object being inspected; dividing the image of the object being inspected to determine at least one region of interest; detecting interaction between a cosmic ray and the region of interest to obtain a detection value; calculating a scattering characteristic value and/or an absorption characteristic value of the cosmic ray in the region of interest based on size information of the region of interest and the detection value; and discriminating a material attribute of the region of interest by means of the scattering characteristic value and/or the absorption characteristic value. With the above technical solutions, inspection accuracy and inspection efficiency may be improved.