The invention provides an evaluation method for irradiating bottom devices to obtain the SEE (Single Event Effect) sensitivity of an electronic system, and gives full consideration to the actual condition that the electronic system and the bottom devices have different failure criteria. Through the one-by-one irradiation of the bottom devices in the electronic system and probability synthesis, themethod achieves the evaluation of the SEE sensitivity of the whole electronic system, and solves a technical problem that a conventional system-level SEE sensitivity evaluation method does not givesconsideration to the apparent difference of the failure criteria of the bottom devices and the electronic system and the single-event protection measure diversity.