The invention relates to a non-uniformity correction baffle test method for an infrared thermal imager based on a temperature variable radiation material. The temperature variable radiation material is introduced into the field of infrared imaging, after the working environment temperature of the infrared thermal imager changes, when adopting a temperature variable-based infrared radiation material to ensure the non-uniformity correction, a correction baffle response is in a two-point correction linear region; in the case of not increasing the extra overhead of software and hardware systems and not changing the system integration time, the non-uniformity caused by the environment temperature change can be eliminated; and after the picture of the infrared thermal imager has a non-uniformityphenomenon due to the change of the working environment temperature, in the case of not changing the system integration time and not increasing the extra overhead of the software and hardware systems, the picture non-uniformity caused by the environment temperature change can be eliminated, and the imaging quality of the infrared thermal imager can be improved.