The invention relates to a method and apparatus for continuous cross-scale internal and external measurement, belonging to the technical field of manufacturing of experimental apparatuses. The methodcomprises the following steps: rotating an X-ray tomoscanner to acquire the internal three-dimensional structure of a sample; automatically separating debris produced in a strength test by using a debris separating device; and allowing the debris to enter a minisized scanning electron microscope through a pipeline and carrying out testing on the debris. The apparatus provided by the invention comprises a central strength testing module, a rotary profile scanning module, a scanning electron microscope module, a support module and a control module. The method and apparatus of the invention can perform all-round scanning on the same object from microstructure to macrostructure and from internal structure to surface structure in a short period of time.