The invention relates to an opaque solid material normal emissivity measurement device and measurement method based on heating of a solar simulator, and relates to a normal emissivity measurement device and measurement method. The invention aims to solve a problem of poor accuracy of an opaque solid material high-temperature normal emissivity measurement method. According to the invention, a sample is directly heated by the solar simulator, interference of repeated reflection to a measurement signal, which is caused by optical windows in conventional high-temperature measurement optical paths,is avoided, and a thermal infrared imager ensures temperature uniformity of the to-be-measured sample; and before an emission spectrum is measured, firstly, a background spectrum of the emission spectrum is measured, the background spectrum is subtracted from the emission spectrum in the calculating process so as to remove interference of a background signal, and by measuring a calibration coefficient, a possibly existing measurement deviation between the measurement optical paths is eliminated. An arranged glass screen can weaken stray radiation of the light source. According to the invention, high-temperature normal emissivity of an opaque solid material can be accurately calculated. The opaque solid material normal emissivity measurement device and measurement method are applicable tohigh-temperature normal emissivity measurement of the opaque solid material.