The invention provides a sample information processing method and a system, which relate to the technical field of material sampling inspection. The method comprises the following steps: scanning a first two-dimensional code of a sample, obtaining basic information of the sample and a sample identification, and storing the basic information and the sample identification correspondingly; Processingthe basic information of the sample to obtain the expected parameters, generating a second two-dimensional code according to the expected parameters and the sample identification, and overlaying thefirst two-dimensional code with the second two-dimensional code; After the sample is detected, the detection result of the sample is obtained, and the second two-dimensional code of the sample is scanned to obtain the sample identification and expected parameters. Generating a third two-dimensional code including the expected parameter and the detection result, Instead of manual encoding and decoding of blind sample processing work, reduce the operator's heavy work, while avoiding errors in human operation, and through the systematic operation of blind sample processing, even if the number ofsamples, can ensure the work efficiency and accuracy.