A test clamp for high-voltage direct-current test includes a tong head and an insulating handle. The tong head is connected with the insulating handle through a spindle to form an X-shaped tong shape.The opening and clamping of the tong head is controlled by controlling the insulating handle. The tong head pieces are replaceable parts, and multiple tong head pieces with different radians can be prepared to adapt to different clamping terminals. Flexible application is realized by replacement. The test clamp is very convenient and flexible to use.