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发明公开
CN109406108A 红外光学材料均匀性测试的温度影响评估和控制方法 有权

红外光学材料均匀性测试的温度影响评估和控制方法
摘要：
本发明涉及红外光学材料均匀性测试的温度影响评估和控制方法，涉及红外光学材料均匀性测试技术领域。本发明基于对红外光学材料折射率均匀性测试期间试样局部小的温度变化对测试结果精度影响的发现，建立了红外光学材料折射率测试精度要求和不同红外光学材料温度变化对折射率影响对应的测试室环境温度控制的二维数值表格关系，并建立了相关计算公式进行数值计算和填表，提供了红外光学材料均匀性测试的温度影响评估和控制方法，建立了红外光学材料均匀性测试的温度影响评估和控制方法的技术解决方案，能够为红外光学材料均匀性测试精度的保证提供温度控制的准确指导。
摘要（英）：

The present invention relates to an infrared optical material homogeneity test temperature influence assessment and control method, and relates to the technical field of infrared optical material homogeneity test. Based on discovery of the influence of small temperature change of part of a sample on test result precision during the infrared optical material refractive index homogeneity test, a two-dimensional value form relation of infrared optical material refractive index test precision requirements and test room environment temperature control corresponding to the influence of different infrared optical material temperature change on the refractive index is established, and a related calculation format is established to perform value calculation and form filling, an infrared optical material homogeneity test temperature influence assessment and control method is provided, and a technical solution scheme of the infrared optical material homogeneity test temperature influence assessment and control method is established, and therefore, accurate guide for temperature control is provided for ensuring the infrared optical material homogeneity test precision.

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