The invention provides a transient common-mode electromagnetic interference test method for a printed circuit board. Besides the monitoring of the response of the whole printed circuit board to the outside interference, the method also achieves the monitoring of the response of a single chip in the printed circuit board to the outside interference. The method provided by the invention can obtain the output waveform of a specific chip in the transient common-mode electromagnetic interference test of an electronic device, and facilitates the analysis of the interference mechanism and the transmission characteristics of disturbance. A cross measurement method is used for removing a measurement error, and the method solves a problem of poorer measurement effect repeatability caused by the changing of the ground potential of the printed circuit board in a test.