Provided is a conductive device dynamic contact resistance test method. The method comprises a conductive device and a dynamic contact resistance tester, conductive rings are arranged on the conductive device, the conductive rings of the conductive device are divided into a test group and a circuit group, a relay on any conductive ring is connected during operation for performing an actual dynamiccontact resistance test of the ring, the other group of all the conductive rings are closed to be responsible for constructing a loop of testing the ring, through multiple sampling by the dynamic contact resistance tester, combined with a formula, the dynamic contact resistance of the conductive ring can be measured, and the problem that the conductive device dynamic contact resistance cannot achieve single loop testing and a harness winding problem during the testing are solved.