The invention discloses a device and method for continuously measuring an output curve of an IGBT (Insulated Gate Bipolar Transistor) chip. The device comprises a capacitor, an inductor, a tested IGBT, an auxiliary IGBT, a flywheel diode, a load resistor, a direct current voltage source, a drive pulse generator, a current measurement device and a voltage measurement device. According to the method, on the basis of a charge/discharge circuit of the inductor, through utilization of a one-time charge/discharge process, a continuously changed current is provided for the tested IGBT, moreover, a current and a voltage of the IGBT are measured, and a whole output curve of the tested IGBT chip can be obtained. An effect of simply and rapidly measuring the output curve of the IGBT chip is achieved.