A spectrometer ( 10 ) for sample surface analysis and a corresponding method of surface analysis spectroscopy. The spectrometer ( 10 ) provides sample viewing and secondary charged particle collection substantially normal to the sample surface. A collection chamber ( 22 ) comprises a secondary charged particle lens arrangement ( 20 ) to focus the emitted particles in a downstream direction along a first normal axis ( 24 ) and thereby to define a charged particle optical crossover location ( 25 ); and a light-reflecting optical element ( 50 ) downstream of the lens arrangement and arranged to receive image light ( 41 ) and reflect it away from a second normal axis ( 42 ) for providing a viewable image of the surface. The optical element ( 50 ) is positioned at, or near to, the crossover location ( 25 ) and comprises an opening ( 52 ) therethrough, such that the focused particles pass through the opening for downstream spectroscopic analysis substantially without obstruction by the optical element.