A flash memory chip testing frame comprises a first testing board and a second testing board, wherein the first testing board and the second testing board are provided with a plurality of rows of bayonet sockets and a plurality of switches respectively, each switch and each bayonet socket are correspondingly and electrically connected, a testing base is spliced into each bayonet socket, each testing base can be provided with a flash memory chip, one side of the first testing board and one side of the second testing board are provided with a plurality of power supply ports and a plurality of USB (universal serial bus) ports respectively, each power supply port can be connected with an external power supply wire to provide power for the corresponding row of the bayonet sockets, each USB port can transmit the testing data of the flash memory chips on the testing bases of the corresponding row of the bayonet sockets outward, the power supply ports and the USB ports on the first testing board and the second testing board direct toward the same direction, the height of the second testing board is different from the height of the first testing board, so that the wires connected onto the first testing board and the wires connected onto the second testing board can be separated, and the operation and the sorting are convenient.