发明公开
EP0017228A1 Memory device 失效
存储设备

Memory device
摘要:
In a dynamic random access memory including means for inputting a row strobe signal and means for inputting a column strobe signal, and having the functions of incorporating a row address input in response to the row strobe signal and incorporating a column address input in response to the column strobe signal; the improvement comprises a first insulated gate field effect transistor having drain coupled to a first junction point, gate receiving the column strobe signal and source supplied with a first power supply, means for charging the first junction point within a period of active level of the row strobe signal, a second insulated gate field effect transistor having a drain coupled to the first junction point, gate coupled to a second junction point and source supplied with the first power supply terminal, means for precharghing the second junction point within a period of absence of the row strobe signal, and a third insulated gate field effect transistor having drain coupled to the second junction point, the gate supplied with the column strobe signal and source supplied with the first power supply. After completion of a desired operation with respect to a selected memory cell, the row strobe signal is made at its inactive level to be reset while the column strobe signal is at its active level. Then, after a necessary reset period when the row strobe signal is made active a change from inactive level to active level of the first junction point is suppressed thereby to inhibit active operation based on the column strobe signal.
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