发明授权
EP0035556B1 ELECTRON BEAM SYSTEM 失效
电子束系统

ELECTRON BEAM SYSTEM
摘要:
Electron beam lens (22) can be operated in a first mode to demagnify and focus the image of electron source (14) at image plane (32). Electron optical lenses (34) and (46) further demagnify the image plane (32) through the focal point (60) on the face of target (58) to provide a scannable exposure spot. Electron optical lens (22) can be operated in the second mode which floods aperture (32) so that the image of the aperture is demagnified and focused on target (58) to provide a large exposure area.
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