发明公开
EP0087776A3 Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
失效
用于增加薄膜光伏器件的耐久性和耐受性的方法和装置
- 专利标题： Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
- 专利标题（中）： 用于增加薄膜光伏器件的耐久性和耐受性的方法和装置
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申请号： EP83101862申请日： 1983-02-25
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公开(公告)号： EP0087776A3公开(公告)日： 1983-10-05
- 发明人: Phillips, James E. , Lasswell, Patrick G.
- 申请人： University of Delaware
- 专利权人： University of Delaware
- 当前专利权人： University of Delaware
- 优先权： US352218 19820225
- 主分类号： H01L31/18
- IPC分类号： H01L31/18 ; G01R31/26
摘要：
Thin film photovoltaic cells having a pair of semiconductor layers between opaque and a transparent electrical contacts are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.
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