发明公开
- 专利标题: Three-dimensional semiconductor device
- 专利标题(中): 三维半导体器件。
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申请号: EP83106114.8申请日: 1983-06-22
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公开(公告)号: EP0097375A1公开(公告)日: 1984-01-04
- 发明人: Miyao, Masanobu , Ohkura, Makoto , Takemoto, Iwao , Warabisako, Terunori , Mukai, Kiichiro , Haruta, Ryo , Kimura, Shinichiro , Tokuyama, Takashi
- 申请人: HITACHI, LTD.
- 申请人地址: 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100 JP
- 专利权人: HITACHI, LTD.
- 当前专利权人: HITACHI, LTD.
- 当前专利权人地址: 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100 JP
- 代理机构: Strehl, Peter, Dipl.-Ing.
- 优先权: JP106225/82 19820622
- 主分类号: H01L27/08
- IPC分类号: H01L27/08
摘要:
At least one layer of insulator film (61-63) and single-crystal film (71-73) are alternately stacked and deposited on a surface of a semiconductor substrate (50), and an impurity-doped region (104-113) formed in each semiconductor film (71-73) is used as a gate, source or drain of a MOS transistor.
Thus, a three-dimensional semiconductor device is constructed in which MOS transistors are arranged, not only in the direction of the semiconductor substrate surface, but also in a direction perpendicular thereto.
Thus, a three-dimensional semiconductor device is constructed in which MOS transistors are arranged, not only in the direction of the semiconductor substrate surface, but also in a direction perpendicular thereto.
公开/授权文献
- EP0097375B1 Three-dimensional semiconductor device 公开/授权日:1986-12-10
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