发明公开
EP0098173A2 Semiconductor integrated-circuit apparatus 失效
半导体集成电路设备

  • 专利标题: Semiconductor integrated-circuit apparatus
  • 专利标题(中): 半导体集成电路设备
  • 申请号: EP83303805.2
    申请日: 1983-06-30
  • 公开(公告)号: EP0098173A2
    公开(公告)日: 1984-01-11
  • 发明人: Sugiyama, EijiSaito, ToshiharuNatsume, Mitsuaki
  • 申请人: FUJITSU LIMITED
  • 申请人地址: 1015, Kamikodanaka, Nakahara-ku Kawasaki-shi, Kanagawa 211 JP
  • 专利权人: FUJITSU LIMITED
  • 当前专利权人: FUJITSU LIMITED
  • 当前专利权人地址: 1015, Kamikodanaka, Nakahara-ku Kawasaki-shi, Kanagawa 211 JP
  • 代理机构: Skone James, Robert Edmund
  • 优先权: JP112778/82 19820630; JP114241/82 19820701; JP233774/82 19821229; JP230288/82 19821229
  • 主分类号: H01L27/02
  • IPC分类号: H01L27/02 H03K19/086
Semiconductor integrated-circuit apparatus
摘要:
A semiconductor integrated-circuit apparatus includes an electro-conductive layer (64, Figure 19) formed on a substrate, a plurality of internal cells (INC) formed on the electro-conductive layer, a plurality of bonding pads (BP) arranged around the internal cells, and a plurality of bias cells (SBC) which are common to the plurality of internal cells and which generate a predetermined voltage. A plurality of bias buffer circuits (INB) supply the predetermined voltage generated in the bias cells to the internal cells.
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