发明公开
- 专利标题: Apparatus and method for particle analysis
- 专利标题(中): 粒子分析的装置和方法
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申请号: EP88303536.2申请日: 1988-04-20
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公开(公告)号: EP0289200A3公开(公告)日: 1990-04-04
- 发明人: Preikschat, Fritz K. , Preikschat, Ekhard
- 申请人: Preikschat, Fritz K. , Preikschat, Ekhard
- 申请人地址: 10901 176th Circle N.E., Apt. 1218 Redmond, Washington 98004 US
- 专利权人: Preikschat, Fritz K.,Preikschat, Ekhard
- 当前专利权人: Preikschat, Fritz K.,Preikschat, Ekhard
- 当前专利权人地址: 10901 176th Circle N.E., Apt. 1218 Redmond, Washington 98004 US
- 代理机构: Arthur, Bryan Edward
- 优先权: US43223 19870427; EP87304423 19870519; US119797 19871112
- 主分类号: G01N15/14
- IPC分类号: G01N15/14
摘要:
Apparatus for analyzing particles contained in a fluent medium (12). The apparatus includes a body (20) having a window (30), an optical source preferably comprising a laser diode (100) having a small light emitting area (140), and an optical system (102) for focusing the light from the laser diode at a focal spot (84) such that the size of the focal spot is approximately equal to the size of the light emitting area of the laser diode. A photodetector (106) is mounted in the body and detects light backscattered from the focal spot by particles in the fluent medium, and produces an electrical signal that comprises a series of pulses associated with the particles. The electrical signal is input to a detector that counts the pulses and indicates the number of particles in the fluent medium. The detector includes discrimination means for preventing the counting of a pulse that has a rise or fall time above a predetermined threshold, thereby discriminating against particles that are not at the focal spot. Means are provided for measuring the integrated amplitude of the electrical signal, and for varying the distance between the focal spot and the window to maximize such integrated amplitude. An intrinsically safe embodiment is also disclosed in which the probe positioned at the measuring site does not include any electrical components. This embodiment may be implemented using light of multiple wavelengths for characterizing individual particles.
公开/授权文献
- EP0289200B2 Apparatus and method for particle analysis 公开/授权日:1998-07-22
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