发明授权
- 专利标题: NON-CONTACT PROFILING METHOD
- 专利标题(中): 联系方式免费配置过程。
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申请号: EP88907828.3申请日: 1988-08-31
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公开(公告)号: EP0328694B1公开(公告)日: 1994-06-29
- 发明人: MATSUURA, Hitoshi
- 申请人: FANUC LTD.
- 申请人地址: 3580, Shibokusa Aza-Komanba, Oshinomura Minamitsuru-gun, Yamanashi 401-05 JP
- 专利权人: FANUC LTD.
- 当前专利权人: FANUC LTD.
- 当前专利权人地址: 3580, Shibokusa Aza-Komanba, Oshinomura Minamitsuru-gun, Yamanashi 401-05 JP
- 代理机构: Billington, Lawrence Emlyn
- 优先权: JP219746/87 19870902
- 国际公布: WO8901845 19890309
- 主分类号: B23Q35/127
- IPC分类号: B23Q35/127
摘要:
In the present invention, a non-contact type probe (PRB) capable of measuring simultaneously distances to three points on a model surface is used to determine inclination increments in the X and Y directions from the distances of the points A, B and C with respect to the probe that are measured at each predetermined sampling time, and calculate the normal direction N of the model at the measuring point A. An increment of each axis per sampling time is determined from (i) the increment of each of the three axes of rotation of the orthogonal coordinates system and the two axes of rotation of the probe necessary for turning the optical axis (OPI) to the normal direction while the measuring point A is kept fixed and (ii) a feed quantity per each sampling time and the distances measured by distance measuring means. While the optical axis (OPI) is directed to the model normal direction by performing simultaneous 5-axis control using these increments, the model (MDL) is profiled.
公开/授权文献
- EP0328694A1 NON-CONTACT PROFILING METHOD 公开/授权日:1989-08-23
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