发明公开
EP0338233A2 Apparatus for measuring the peak voltage applied to a radiation source
失效
Apparat zur Messung der a einer Strahlungsquelle angelegten Spitzenspannung。
- 专利标题: Apparatus for measuring the peak voltage applied to a radiation source
- 专利标题(中): Apparat zur Messung der a einer Strahlungsquelle angelegten Spitzenspannung。
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申请号: EP89104081.8申请日: 1989-03-08
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公开(公告)号: EP0338233A2公开(公告)日: 1989-10-25
- 发明人: Sheridan, Terrence E.
- 申请人: KEITHLEY INSTRUMENTS, INC.
- 申请人地址: 28775 Aurora Road Solon, Ohio 44139-1891 US
- 专利权人: KEITHLEY INSTRUMENTS, INC.
- 当前专利权人: KEITHLEY INSTRUMENTS, INC.
- 当前专利权人地址: 28775 Aurora Road Solon, Ohio 44139-1891 US
- 代理机构: Leiser, Gottfried, Dipl.-Ing.
- 优先权: US185138 19880422
- 主分类号: H05G1/26
- IPC分类号: H05G1/26 ; G21K1/10
摘要:
Apparatus is provided for use in detecting the peak voltage applied to a radiation source operating at an unknown input voltage. The apparatus includes a set of radiation absorbing filters including a first filter which includes a first element that exhibits a known K-absorption edge and a second filter constructed of a second element so that the filters exhibit essentially the same radiation absorption characteristics below the K-absorption edge of the first filter. The filters are adapted to be positioned so as to be irradiated by the radiation source so that the radiation impinges upon a surface of each filter and is partially absorbed as it passes therethrough so as to exit therefrom as attenuated radiation. A detector, such as X-ray film or a pair of photodiodes, is positioned for receiving the attenuated radiation passed by the first and second filters and provides an output indication when the radiation passed by the filters is differently attenuated. This is indicative that the known K-absorption edge of the first filter has been exceeded, thereby providing an indication as to the magnitude of the voltage applied to the radiation source.
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