Invention Grant
- Patent Title: Laser based measurement system
- Patent Title (中): Lasermesssystem。
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Application No.: EP89308457.4Application Date: 1989-08-21
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Publication No.: EP0358368B1Publication Date: 1994-04-13
- Inventor: Cain, Gary Lynn , Sobottke, Mark Durward , Rando, Joseph Francis
- Applicant: SPECTRA-PHYSICS LASERPLANE, INC.
- Applicant Address: 5475 Kellenburger Road Dayton, Ohio 45424-1099 US
- Assignee: SPECTRA-PHYSICS LASERPLANE, INC.
- Current Assignee: SPECTRA-PHYSICS LASERPLANE, INC.
- Current Assignee Address: 5475 Kellenburger Road Dayton, Ohio 45424-1099 US
- Agency: Murgatroyd, Susan Elizabeth
- Priority: US234565 19880822
- Main IPC: G01C15/00
- IPC: G01C15/00 ; G01S17/10
Public/Granted literature
- EP0358368A1 Laser based measurement system Public/Granted day:1990-03-14
Information query
