发明公开
EP0380682A1 METHOD OF FABRICATING SEMICONDUCTOR DEVICES 失效
VERFAHREN ZUR HERSTELLUNG VON HALBLEITERANORDNUNGEN。

  • 专利标题: METHOD OF FABRICATING SEMICONDUCTOR DEVICES
  • 专利标题(中): VERFAHREN ZUR HERSTELLUNG VON HALBLEITERANORDNUNGEN。
  • 申请号: EP89907275.5
    申请日: 1989-06-15
  • 公开(公告)号: EP0380682A1
    公开(公告)日: 1990-08-08
  • 发明人: OHMI, TadahiroSHIBATA, TadashiUMEDA, Masaru
  • 申请人: Ohmi, Tadahiro
  • 申请人地址: 1-17-301, Komegabukuro 2-chome Aoba-ku Sendai-shi Miyagi-ken 980 JP
  • 专利权人: Ohmi, Tadahiro
  • 当前专利权人: Ohmi, Tadahiro
  • 当前专利权人地址: 1-17-301, Komegabukuro 2-chome Aoba-ku Sendai-shi Miyagi-ken 980 JP
  • 代理机构: Rees, David Christopher
  • 优先权: JP15058188 19880617
  • 国际公布: WO1989012909 19891228
  • 主分类号: H01L21/203
  • IPC分类号: H01L21/203
METHOD OF FABRICATING SEMICONDUCTOR DEVICES
摘要:
A method of fabricating semiconductor devices and, particularly, an art for forming thin-film semiconductor elements on a substrate. The fabrication method comprises a step for forming a conductor layer having a step on at least a portion on one main surface of the substrate, and a step for forming a semiconductor thin film on the substrate under the condition where a dc potential is being given to the conductor layer. The low-temperature process of the invention makes it possible to easily form a single- crystal semiconductor layer of high quality on any insulating substrate. Therefore, very high-speed semiconductor devices and high-performance flat panel displays can be manufactured.
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