发明公开
- 专利标题: A process of linearizing non-linear analog-to-digital conversion the process and circuit for performing
- 专利标题(中): 线性化非线性模拟数字转换的过程执行过程和电路
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申请号: EP91119382.9申请日: 1991-11-13
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公开(公告)号: EP0514587A3公开(公告)日: 1993-09-22
- 发明人: Patel, Chandrakant B. , Meyer, Thomas
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: 416 Maetan-Dong, Kwonsun-Gu Suwon-City, Kyounggi-Do 441-370 KR
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: 416 Maetan-Dong, Kwonsun-Gu Suwon-City, Kyounggi-Do 441-370 KR
- 代理机构: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权: US704986 19910524
- 主分类号: H03M1/06
- IPC分类号: H03M1/06
摘要:
A circuit for linearizing analog-to-digital output is shown in Figure 2, with an analog signal V i transmitted by input circuit 10 is applied to an input port of an analog-to-digital converter 12 controlled by a sampling signal V s , to provide digital data V d on an "N" bit data bus 14. An analog-to-digital linearizing memory 16 storing a look-up table of digital values, is coupled to bus 14 to receive the digital data V d , and to respond to the digital data V d by providing true linear digital values from the look-up table to digital data processing system DSP 20 via an "N" bit data bus 18. A microprocessor 22 is temporarily coupled between the output port of converter 12 and the input port of memory 16 via bus 14, to serve as a switch between bus 14 and a programming memory 24 containing a table of true linear digital values V t . A known test signal is applied to input circuit 10, and true linear digital values V t stored in programming memory 24, are then read into linearizing memory 16 to provide an accurate and reliable relation to a characteristic such as the amplitude of each step of the known test signal over the entire range of the known test signal.
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