发明授权
- 专利标题: Uncooled infrared detector and method for forming the same
- 专利标题(中): 非制冷红外检测器及其制造方法
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申请号: EP92308737.3申请日: 1992-09-25
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公开(公告)号: EP0534768B1公开(公告)日: 1996-05-15
- 发明人: Keenan, William F.
- 申请人: TEXAS INSTRUMENTS INCORPORATED
- 申请人地址: 13500 North Central Expressway Dallas Texas 75265 US
- 专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人: TEXAS INSTRUMENTS INCORPORATED
- 当前专利权人地址: 13500 North Central Expressway Dallas Texas 75265 US
- 代理机构: Blanco White, Henry Nicholas
- 优先权: US768801 19910930; US766879 19910927
- 主分类号: G01J5/20
- IPC分类号: G01J5/20 ; H01L27/146
摘要:
A method of detecting the intensity of radiation emanating from an object 116 relative to a background level at a pixel detector 120 is disclosed herein. A resistive element 122 with a resistance dependent upon the intensity of radiation impinging the detector 120 and having first and second terminals is provided along with an integration element 124 coupled to the first terminal of the resistive element. The first terminal is set to a reference voltage. The radiation is then defocused such that the radiation impinging the detector 120 is proportional to the background radiation level and a first voltage is applied to the second terminal of the resistive element 122 such that the integration element 124 discharges to a background voltage level. Next, the radiation is focused such that the radiation impinging the detector 120 is proportional to the radiation emanating from the object 116 and a second voltage is applied to the second terminal of the resistive element 122 such that the integration element 124 charges to an output voltage Vo level. The output voltage Vo is then sensed. Other systems and methods are also disclosed.
公开/授权文献
- EP0534768A1 Uncooled infrared detector and method for forming the same 公开/授权日:1993-03-31
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