Invention Grant
- Patent Title: Semiconductor memory and screening test method thereof
- Patent Title (中): 半导体存储器及其Siebtestverfahren
-
Application No.: EP92119825.5Application Date: 1992-11-20
-
Publication No.: EP0543408B1Publication Date: 1998-10-07
- Inventor: Kushiyama, Natsuki, c/o Intellectual Property Div. , Furuyama, Tohru, c/o Intellectual Property Div. , Numata, Kenji, c/o Intellectual Property Div.
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: 72, Horikawa-cho, Saiwai-ku Kawasaki-shi, Kanagawa-ken 210 JP
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: 72, Horikawa-cho, Saiwai-ku Kawasaki-shi, Kanagawa-ken 210 JP
- Agency: Lehn, Werner, Dipl.-Ing.
- Priority: JP304335/91 19911120; JP304343/91 19911120
- Main IPC: G11C29/00
- IPC: G11C29/00
Public/Granted literature
- EP0543408A3 Semiconductor memory and screening test method thereof Public/Granted day:1995-08-09
Information query
