Invention Grant
EP0568016B1 Semiconductor memory device having multiple selector unit simultaneously selecting memory cells from memory cell blocks in test mode of operation
失效
与存储器单元Mehrselektoreinheit一种半导体存储器设备，用于在测试模式下操作存储器单元块同时选择
- Patent Title: Semiconductor memory device having multiple selector unit simultaneously selecting memory cells from memory cell blocks in test mode of operation
- Patent Title (中): 与存储器单元Mehrselektoreinheit一种半导体存储器设备，用于在测试模式下操作存储器单元块同时选择
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Application No.: EP93106821.7Application Date: 1993-04-27
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Publication No.: EP0568016B1Publication Date: 1998-12-09
- Inventor: Ueoka, Junji, c/o NEC Corporation
- Applicant: NEC CORPORATION
- Applicant Address: 7-1, Shiba 5-chome Minato-ku Tokyo JP
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: 7-1, Shiba 5-chome Minato-ku Tokyo JP
- Agency: Glawe, Delfs, Moll & Partner
- Priority: JP107169/92 19920427
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C8/00
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