发明授权
- 专利标题: TESTING IMPLANTS
- 专利标题(中): IMPLANTATEUNTERSUCHUNG
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申请号: EP92908187.5申请日: 1992-04-13
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公开(公告)号: EP0579673B1公开(公告)日: 1996-07-10
- 发明人: CAWLEY, Peter , MEREDITH, Neil
- 申请人: IMPERIAL COLLEGE OF SCIENCE, TECHNOLOGY & MEDICINE
- 申请人地址: Sherfield Building, Exhibition Road London SW7 2AZ GB
- 专利权人: IMPERIAL COLLEGE OF SCIENCE, TECHNOLOGY & MEDICINE
- 当前专利权人: IMPERIAL COLLEGE OF SCIENCE, TECHNOLOGY & MEDICINE
- 当前专利权人地址: Sherfield Building, Exhibition Road London SW7 2AZ GB
- 代理机构: Warren, Anthony Robert
- 优先权: GB9107700 19910411
- 国际公布: WO9218053 19921029
- 主分类号: A61B5/103
- IPC分类号: A61B5/103 ; G01H13/00 ; A61C19/04 ; A61F2/02 ; A61B9/00
摘要:
Apparatus for testing an implant (3) attached to a bone (4) of a human or animal subject comprises a cantilever beam (1) releasably attached to the implant. The beam carries a transducer (5) for exciting the beam (1) with a variable frequency AC signal, and a transducer (6) for detecting a resonance frequency of the beam. The detected resonance frequency is used to assess the degree of attachment of the implant (3) to the bone (1).
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