发明公开
EP0663681A1 Cathode ray tube and deflection aberration correcting method of the same
失效
Kathodenstrahlröhreund Ablenkungsaberration-Kompensationsverfahren。
- 专利标题: Cathode ray tube and deflection aberration correcting method of the same
- 专利标题(中): Kathodenstrahlröhreund Ablenkungsaberration-Kompensationsverfahren。
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申请号: EP94100251.1申请日: 1994-01-10
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公开(公告)号: EP0663681A1公开(公告)日: 1995-07-19
- 发明人: Misono, Masayoshi
- 申请人: HITACHI, LTD.
- 申请人地址: 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 101 JP
- 专利权人: HITACHI, LTD.
- 当前专利权人: HITACHI, LTD.
- 当前专利权人地址: 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 101 JP
- 代理机构: Patentanwälte Beetz - Timpe - Siegfried Schmitt-Fumian - Mayr
- 主分类号: H01J29/50
- IPC分类号: H01J29/50 ; H01J29/56
摘要:
A cathode ray tube which is equipped with an electron gun (K) having a construction capable of not only improving the focusing characteristics for the entire region of a screen (14) and for the total current range of an electron beam (10) without any supply of a dynamic focusing voltage to achieve a satisfactory resolution, but also reducing the Moire phenomena in a low current range. Also disclosed is a method of correcting the deflection aberration of the cathode tube. A deflection aberration according to the deflection of the electron beam (10) is corrected by establishing a fixed inhomogeneous electric field, which has its equipotential lines narrowed in interval the more for the longer distance from the axis of symmetry of an electric field.
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