发明公开
EP0697108A1 A METHOD FOR SIMULTANEOUSLY MEASURING THE POSITIONS OF MORE THAN ONE SURFACE IN METALLURGIC PROCESSES
失效
操作法,不止一个表面冶金过程中的积极作用的同时测量
- 专利标题: A METHOD FOR SIMULTANEOUSLY MEASURING THE POSITIONS OF MORE THAN ONE SURFACE IN METALLURGIC PROCESSES
- 专利标题(中): 操作法,不止一个表面冶金过程中的积极作用的同时测量
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申请号: EP94906422.0申请日: 1994-02-03
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公开(公告)号: EP0697108A1公开(公告)日: 1996-02-21
- 发明人: BAATH, Lars
- 申请人: MEFOS-STIFTELSEN FÖR METALLURGISK FORSKNING
- 申请人地址: Box 812 S-951 28 Lulea SE
- 专利权人: MEFOS-STIFTELSEN FÖR METALLURGISK FORSKNING
- 当前专利权人: MEFOS-STIFTELSEN FÖR METALLURGISK FORSKNING
- 当前专利权人地址: Box 812 S-951 28 Lulea SE
- 代理机构: Aslund, Roland
- 优先权: SE19930000348 19930203
- 国际公布: WO1994018549 19940818
- 主分类号: B22D2
- IPC分类号: B22D2 ; G01B15 ; G01F23 ; G01N22 ; G01S13
摘要:
A measuring technique and method are provided to simultaneously determine the positions of the surfaces of slag and metal bath in metallurgical processes. In the metallurgical process industry, e.g. in converter processes, it is important to measure the thickness of the layer of slag on top of the metal bath as well as determine the actual volume of metal in order to determine the weight of the charge. A large number of various methods have been tried, but no method is known to result in fast and accurate measurements of both surfaces from a distance and without mechanical means. The herein presented invention describe a method whereby radio waves are transmitted over a frequency band perpendicular towards the surfaces and how a receiver is used to compare the phase of the reflected waves relative the transmitted wave. The phase-change is measured for a number of frequency channels and a transform is then used to transform from the frequency space to the time delay space which gives the positions. The method is suitable for measuring overlapping surfaces at large distances from the reference level and which are separated by large distances. The estimated errors of the method are as low as 2 mm. If an interferometer is used as antenna then the data will also be sampled in the aperture plane and the three dimensional structure of the surfaces can be reconstructed.
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