发明公开
EP0698788A1 METHOD AND DEVICE FOR MEASURING VARIATION IN DECOMPOSITION RATE OF SPECIAL MATERIAL GAS
失效
的方法和装置,用于测量由特殊材料气体的衰减率的变化
- 专利标题: METHOD AND DEVICE FOR MEASURING VARIATION IN DECOMPOSITION RATE OF SPECIAL MATERIAL GAS
- 专利标题(中): 的方法和装置,用于测量由特殊材料气体的衰减率的变化
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申请号: EP92910164.0申请日: 1992-05-13
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公开(公告)号: EP0698788A1公开(公告)日: 1996-02-28
- 发明人: OHMI, Tadahiro
- 申请人: OHMI, Tadahiro
- 申请人地址: 1-17-301, Komegabukuro 2-chome Aoba-ku Sendai-shi Miyagi-ken 980 JP
- 专利权人: OHMI, Tadahiro
- 当前专利权人: OHMI, Tadahiro
- 当前专利权人地址: 1-17-301, Komegabukuro 2-chome Aoba-ku Sendai-shi Miyagi-ken 980 JP
- 代理机构: Weitzel, Wolfgang, Dr.-Ing. Patentanwalt
- 优先权: JP157653/91 19910531
- 国际公布: WO9221967 19921210
- 主分类号: G01N30/06
- IPC分类号: G01N30/06 ; G01N30/00 ; G01N33/00
摘要:
A method and a device for measuring detailed decomposition rate characteristic of special material gas such as silane gas. After inert gas is supplied from a gas purifier (1) (a first gas-supply source) into a reaction pipe (20) to provide a high purity atmosphere in said pipe, the inside of said pipe is baked by heaters (25 to 27). Then, the inside of the reaction pipe (20) is kept in an atmosphere at a specified temperature and special material gas with a specified purity is supplied from a bomb (10) (a second gas-supply source) into the reaction pipe at a fixed flow rate. When the inside of the reaction pipe (20) reaches a specified terminal temperature, a decomposition rate of the special material gas at said temperature is measured by a gas chromatography (12) by, for example, extracting a part of gas in the reaction pipe. Afterward, a flow rate of the special material gas is successively varied and a decomposition rate at every time of variation is measured. Further, an atmosphere inside the reaction pipe (20) is successively set to one at another specified temperature for measuring a decomposition rate at every temperature. With an impurity concentration in the special gas varied, said measurement is repeated.
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