发明公开
- 专利标题: DNA analyzing method and device therefor
- 专利标题(中): 用于DNA分析的方法和装置
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申请号: EP95117722.9申请日: 1995-11-09
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公开(公告)号: EP0711840A3公开(公告)日: 1997-04-23
- 发明人: Fujita, Takeshi , Umemura, Shin-ichiro
- 申请人: HITACHI, LTD.
- 申请人地址: 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100 JP
- 专利权人: HITACHI, LTD.
- 当前专利权人: HITACHI, LTD.
- 当前专利权人地址: 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo 100 JP
- 代理机构: Strehl Schübel-Hopf Groening & Partner
- 优先权: JP274735/94 19941109
- 主分类号: C12Q1/68
- IPC分类号: C12Q1/68 ; G01N35/00
摘要:
The object of the present invention is to provide a method capable of analyzing the presence or absence of a target DNA sequence, the level and sequence characteristics thereof at a high sensitivity, and a device therefor, wherein the overall process from pretreatment to the recovery of DNA information and the analysis thereof can be completed in a speedy fashion by the simple device structure and procedures. Therefore, by preparing a single-stranded DNA fragment of a target DNA region, detecting the change in the absorbance of the single-stranded DNA sample while changing the denaturing condition of the conformation of the single-stranded DNA fragment by a denaturing condition regulatory means, and analyzing the curve of the change in the absorbance over the modification in the denaturing condition, the sequence information of the single-stranded DNA, namely the target DNA, can be generated in a rapid and simple manner.
公开/授权文献
- EP0711840B1 DNA analyzing method and device therefor 公开/授权日:2002-06-19
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