发明公开
EP0772265A1 Laser light source apparatus, OTDR apparatus, and optical communication line inspection system
失效
激光切割机,OTDR-Gerätund InspektionssystemfüroptischeFernübertragungsleitern
- 专利标题: Laser light source apparatus, OTDR apparatus, and optical communication line inspection system
- 专利标题(中): 激光切割机,OTDR-Gerätund InspektionssystemfüroptischeFernübertragungsleitern
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申请号: EP96115368.1申请日: 1996-09-25
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公开(公告)号: EP0772265A1公开(公告)日: 1997-05-07
- 发明人: Shigehara, Masakazu, c/o Sumitomo Elec. Ind., Ltd. , Inoue, Akira, c/o Sumitomo Elec. Ind., Ltd.
- 申请人: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- 申请人地址: 5-33, Kitahama 4-chome, Chuo-ku Osaka-shi, Osaka 541 JP
- 专利权人: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- 当前专利权人: SUMITOMO ELECTRIC INDUSTRIES, LTD.
- 当前专利权人地址: 5-33, Kitahama 4-chome, Chuo-ku Osaka-shi, Osaka 541 JP
- 代理机构: Ritter und Edler von Fischern, Bernhard, Dipl.-Ing.
- 优先权: JP285068/95 19951101; JP248255/96 19960919
- 主分类号: H01S3/085
- IPC分类号: H01S3/085 ; G01M11/00 ; H04B10/08
摘要:
The pulse laser light source apparatus in the OTDR apparatus of present invention comprises an optical waveguide which receives and guides the light emitted from the first light-emitting end face, wherein the optical waveguide comprises a reflecting area which selectively reflects a part of light emitted from a light-emitting end face of a semiconductor light-emitting device, a core of the reflecting area comprises a first diffraction grating which is disposed in a first area and whose refractive index periodically changes along an optical-axis direction, the first diffraction grating selectively reflects, of the light emitted from the light-emitting end face of the semiconductor light-emitting device, a part of the light within a first wavelength range. And the diffraction grating is one of denvices which constitute a laser resonator.
公开/授权文献
- EP0772265B1 OTDR apparatus 公开/授权日:2003-06-11
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