发明公开
- 专利标题: Micrometer
- 专利标题(中): 千分尺
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申请号: EP97301196.8申请日: 1997-02-24
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公开(公告)号: EP0791801A2公开(公告)日: 1997-08-27
- 发明人: Takahashi, Seigo, C/o Mitutoyo Corporation , Suzuki, Masamichi, C/o Mitutoyo Corporation , Tachikake, Masahiko, C/o Mitutoyo Corporation
- 申请人: Mitutoyo Corporation
- 申请人地址: 20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi, Kanagawa-ken JP
- 专利权人: Mitutoyo Corporation
- 当前专利权人: Mitutoyo Corporation
- 当前专利权人地址: 20-1, Sakado 1-chome, Takatsu-ku Kawasaki-shi, Kanagawa-ken JP
- 代理机构: Jackson, Peter Arthur
- 优先权: JP37926/96 19960226
- 主分类号: G01B3/18
- IPC分类号: G01B3/18
摘要:
A main scale graduation, an auxiliary scale graduation or the like provided in a conventional micrometer is omitted, and a thimble 71 is provided at a regular position in the axial direction of the spindle 61 through a sleeve 51 in a frame 1 to rotate about the axis of a spindle 61. Between the thimble 71 and the spindle 61, a rotation transfer means 81 for transferring the rotation of the thimble 71 to the spindle 61 and allowing the spindle 61 to displace in the axial direction of the spindle 61. As the rotation transfer means 81, a ratchet system 82 is used.
公开/授权文献
- EP0791801B1 Micrometer 公开/授权日:2001-07-04
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