发明公开
- 专利标题： Multiple on-chip IDDQ monitors
- 专利标题（中）： “多上的单芯片” IDDQ监测
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申请号： EP97307780.3申请日： 1997-10-02
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公开(公告)号： EP0838760A3公开(公告)日： 1998-06-17
- 发明人: Brown, Charles Allen
- 申请人： Hewlett-Packard Company
- 申请人地址： 3000 Hanover Street Palo Alto, California 94304 US
- 专利权人： Hewlett-Packard Company
- 当前专利权人： Hewlett-Packard Company
- 当前专利权人地址： 3000 Hanover Street Palo Alto, California 94304 US
- 代理机构： Colgan, Stephen James
- 优先权： US732077 19961016
- 主分类号： G06F11/24
- IPC分类号： G06F11/24 ; G01R31/317
摘要：
In order to measure IDDQ in a large integrated circuit, multiple IDDQ monitors sampling the current drawn by selected portions of the circuit are placed on the integrated circuit chip. The output of each IDDQ monitor is combined and supplied to one output port (207) when any of the IDDQ monitors detect current in excess of a predetermined threshold. The output of each IDDQ monitor is also stored in a memory (209) for subsequent readout at a second output port (211) for detection of particular portions drawing the excessive current.
公开/授权文献
- EP0838760B1 Multiple on-chip IDDQ monitors 公开/授权日：2002-01-02
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