A rolling contactor is described for testing electronic devices having a plurality of very closely spaced, linearly aligned terminals, e.g. ceramic chips (6) containing an array of capacitors, packaged no larger than a single 1206 chip capacitor (0.120 x 0.60). Such chips have like pluralities of linearly aligned terminals (10, 12) along opposite sides. The contactor (2) includes a plurality of juxtaposed contact wheels (20, 24), each wheel being individually suspended by a corresponding cantilever arm (52, 54). The wheels are spaced to register with a line of terminals, and the arms are resilient enough to apply, when flexed, sufficient axial force to their respective wheels to make good contact with the terminals. Two of such multiple rolling contactors can be opposally positioned for simultaneously contacting lines of terminals on opposite sides of a chip array passing therebetween. In such a case, the wheels of one contactor are positioned to impinge registered terminals along one edge of the array, while the wheels of the opposing contactor simultaneously impinge registered terminals along the opposite edge of the array.