发明公开
EP1026915A2 Method and system for enhancing cell error ratio and cell misinsertion rate for a given cell loss ratio
审中-公开
为提高电池的错误率和特定的细胞损失率错电池插入速率法
- 专利标题： Method and system for enhancing cell error ratio and cell misinsertion rate for a given cell loss ratio
- 专利标题（中）： 为提高电池的错误率和特定的细胞损失率错电池插入速率法
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申请号： EP00101632.8申请日： 2000-01-31
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公开(公告)号： EP1026915A2公开(公告)日： 2000-08-09
- 发明人: Wright, David A. , Caso, Gregory S. , Linsky, Stuart T.
- 申请人： TRW Inc.
- 申请人地址： One Space Park Redondo Beach, California 90278 US
- 专利权人： TRW Inc.
- 当前专利权人： TRW Inc.
- 当前专利权人地址： One Space Park Redondo Beach, California 90278 US
- 代理机构： Schmidt, Steffen J., Dipl.-Ing.
- 优先权： US243163 19990202
- 主分类号： H04Q11/04
- IPC分类号： H04Q11/04
摘要：
A method and apparatus for enhancing the cell error ratio and the cell misinsertion rate for a given cell loss ratio is provided. A predetermined number, C, of ATM cells (150, 250) are packed together and encoded using a strong t-error correcting BCH block code, such as a Reed-Solomon code to produce an encoded block (162, 262). After transmission, the received data segment (156, 256) may include s errors. The data segment (156, 256) is decoded, and if s > t, decoder failure occurs with very high probability and the data segment is discarded. The CER obtained is superior to present ATM systems. The decoded block is unpacked into C ATM cells (160, 260). Optionally, the header fields (164, 264) of the C ATM cells may be decoded. In most cases where errors are present in the header, nonzero syndrome occurs with high probability, and the C ATM cells (160, 260) are discarded. The CMR obtained is superior to present ATM systems. The delivered ATM cells (160, 260) are virtually error free with very high certainty.
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