发明公开
- 专利标题: Distance measuring apparatus
- 专利标题(中): 测距仪
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申请号: EP00110243.3申请日: 2000-05-19
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公开(公告)号: EP1054267A2公开(公告)日: 2000-11-22
- 发明人: Ohishi, Masahiro , Tokuda, Yoshikatsu
- 申请人: KABUSHIKI KAISHA TOPCON
- 申请人地址: 75-1, Hasunuma-cho Itabashi-ku Tokyo 174 JP
- 专利权人: KABUSHIKI KAISHA TOPCON
- 当前专利权人: KABUSHIKI KAISHA TOPCON
- 当前专利权人地址: 75-1, Hasunuma-cho Itabashi-ku Tokyo 174 JP
- 代理机构: Altenburg, Udo, Dipl.-Phys.
- 优先权: JP14237399 19990521
- 主分类号: G01S17/08
- IPC分类号: G01S17/08 ; G01S7/491 ; G01S7/481
摘要:
The present invention relates to a distance measuring apparatus having an attenuation filter for adjusting luminous energy of a luminous flux incident on light receiving converting means. An object of the present invention is to provide a distance measuring apparatus in which at least a part of the attenuation filter is arranged as deflection means. According to the arrangement of the distance measuring apparatus of the present invention, a light projecting system irradiates a measuring luminous flux toward an object under measurement, a light receiving system receives the reflected luminous flux reflected on the object under measurement and leading the reflected light to light receiving converting means, and a distance from a position at which measurement is carried out to a position at which the object under measurement is located, is measured based on the reflected luminous flux received by the light receiving converting means. An attenuation filter adjusts luminous energy of the luminous flux incident on the light receiving converting means, and at least a part of the attenuation filter is arranged as deflection means.
公开/授权文献
- EP1054267B1 Distance measuring apparatus 公开/授权日:2007-08-08
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