发明授权
- 专利标题: METHOD OF MANUFACTURING THIN-FILM TRANSISTOR
- 专利标题(中): 方法操作部门的薄膜场效应晶体管
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申请号: EP00912943.8申请日: 2000-03-29
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公开(公告)号: EP1113502B1公开(公告)日: 2007-09-19
- 发明人: YUDASAKA, Ichio , SHIMODA, Tatsuya , SEKI, Shunichi
- 申请人: SEIKO EPSON CORPORATION
- 申请人地址: 4-1, Nishi-shinjuku 2-chome Shinjuku-ku Tokyo 163-0811 JP
- 专利权人: SEIKO EPSON CORPORATION
- 当前专利权人: SEIKO EPSON CORPORATION
- 当前专利权人地址: 4-1, Nishi-shinjuku 2-chome Shinjuku-ku Tokyo 163-0811 JP
- 代理机构: Sturt, Clifford Mark
- 优先权: JP9031099 19990330
- 国际公布: WO2000059040 20001005
- 主分类号: H01L29/786
- IPC分类号: H01L29/786 ; H01L21/336 ; H01L21/208 ; H01L21/316 ; H01L21/288 ; G02F1/1368
摘要:
All or part of thin film, such as silicon film, insulating film and a conducting film, which composes a thin-film transistor are formed using liquid materials. Coating of liquid material on a substrate is heat-treated to form desired thin film.
公开/授权文献
- EP1113502A1 METHOD OF MANUFACTURING THIN-FILM TRANSISTOR 公开/授权日:2001-07-04
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