发明公开
EP1124129A3 Device and method for two-dimensional detection of particles or electromagnetic radiation
有权
检测粒子的或电磁辐射在两个维度上的方法和装置
- 专利标题: Device and method for two-dimensional detection of particles or electromagnetic radiation
- 专利标题(中): 检测粒子的或电磁辐射在两个维度上的方法和装置
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申请号: EP01102954.3申请日: 2001-02-07
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公开(公告)号: EP1124129A3公开(公告)日: 2005-08-24
- 发明人: Jagutzki, Ottmar , Schmidt-Böcking, Horst , Mergel, Volker , Cerezo, Alfred , Huang, Min
- 申请人: Roentdek Handels GmbH , Oxford Nanoscience Limited
- 申请人地址: Im Vogelshaag 8 65779 Kelkheim-Ruppertshain DE
- 专利权人: Roentdek Handels GmbH,Oxford Nanoscience Limited
- 当前专利权人: Roentdek Handels GmbH,Oxford Nanoscience Limited
- 当前专利权人地址: Im Vogelshaag 8 65779 Kelkheim-Ruppertshain DE
- 代理机构: Blumbach - Zinngrebe
- 优先权: GB0003261 20000211
- 主分类号: H01J37/244
- IPC分类号: H01J37/244 ; H01J47/06 ; H01J49/02 ; G01T1/29
摘要:
The invention concerns a device and method for two-dimensional imaging and timing of particles or electromagnetic radiation with improved pulse-pair resolution. A detector, e.g. a michrochannel plate detector with a delay-line anode with three or more conductive members is used as exemplary embodiment for achieving these requirements. Redundant position and timing information is used for uniquely determine the timing and position of two or more particles, even if they arrive at the same time at the detector.
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