发明公开
EP1139108A2 Scan interface with TDM feature for permitting signal overlay
有权
阿拉伯联合酋长国Zeitmultiplexerkmal zurSignalüberlagerung
- 专利标题： Scan interface with TDM feature for permitting signal overlay
- 专利标题（中）： 阿拉伯联合酋长国Zeitmultiplexerkmal zurSignalüberlagerung
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申请号： EP01200790.2申请日： 2001-03-02
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公开(公告)号： EP1139108A2公开(公告)日： 2001-10-04
- 发明人: Swoboda, Gary L.
- 申请人： Texas Instruments Incorporated
- 申请人地址： 7839 Churchill Way, Mail Station 3999 Dallas, Texas 75251 US
- 专利权人： Texas Instruments Incorporated
- 当前专利权人： Texas Instruments Incorporated
- 当前专利权人地址： 7839 Churchill Way, Mail Station 3999 Dallas, Texas 75251 US
- 代理机构： Holt, Michael
- 优先权： US515093 20000302; US219340P 20000302; US186326P 20000302
- 主分类号： G01R31/3185
- IPC分类号： G01R31/3185
摘要：
A scan interface that includes control signals (TRST, TMS, TCK) and data signals (TDI, TDO) normally carried by respective signal paths of the scan interface can be used to carry signals other than signals of the scan interface. A first signal (TMS) and a second signal (TDO) can be time division multiplexed on the signal path that normally carries one of the signals, thereby freeing the signal path that carries the other of the signals to carry a signal other than a signal of the scan interface.
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