发明公开
EP1213716A2 Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof
审中-公开
数据记录和制造接触电阻测量的再现设备和数据记录和-WIDERGABEMETHODE USE
- 专利标题： Apparatus for recording and reading data and method of recording and reading data using contact resistance measurement thereof
- 专利标题（中）： 数据记录和制造接触电阻测量的再现设备和数据记录和-WIDERGABEMETHODE USE
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申请号： EP01124829.1申请日： 2001-10-18
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公开(公告)号： EP1213716A2公开(公告)日： 2002-06-12
- 发明人: Choi, Jae-joon, 1Curie Lab Inc. , Jeon, Jong Up, School of Mech.& Auto.Engineering , Shin, Jung-gyu
- 申请人： SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址： 416, Maetan-dong, Paldal-gu Suwon-City, Kyungki-do KR
- 专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人： SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址： 416, Maetan-dong, Paldal-gu Suwon-City, Kyungki-do KR
- 代理机构： Patentanwälte , Ruff, Wilhelm, Beier, Dauster & Partner
- 优先权： KR2000072596 20001201
- 主分类号： G11B9/00
- IPC分类号： G11B9/00 ; G11B9/04
摘要：
An apparatus for recording and reading data by measuring contact resistance and a method for recording and reading data thereof are provided. The apparatus for recording and reading data includes a storage medium and a probe which is installed to face the storage medium and is used for recording data on the storage medium and reading the data from the storage medium. The storage medium includes a substrate (35), a conductive layer (34) formed on the substrate and a dielectric layer (33) formed on the conductive layer. With the apparatus for recording and reading data, it is possible to solve problems concerning data retention, data read speed and signal-to-noise ratio which have been at issue in developing data storage media with the use of conventional scanning probe microscopic techniques.
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