发明公开
EP1267161A2 Inspection probe and system comprising a pulsed eddy current two-dimensional sensor array
有权
Prüfsondeund System mit einer gepulsten,zweidimensionalen Wirbelstromsensoranordnung
- 专利标题: Inspection probe and system comprising a pulsed eddy current two-dimensional sensor array
- 专利标题(中): Prüfsondeund System mit einer gepulsten,zweidimensionalen Wirbelstromsensoranordnung
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申请号: EP02254028.0申请日: 2002-06-10
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公开(公告)号: EP1267161A2公开(公告)日: 2002-12-18
- 发明人: Plotnikov, Yuri Alexeyevich , Nath, Shridhar Champaknath , Rose, Curtis Wayne , Batzinger, Thomas James , Herd, Kenneth Gordon
- 申请人: GENERAL ELECTRIC COMPANY
- 申请人地址: 1 River Road Schenectady, NY 12345 US
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: 1 River Road Schenectady, NY 12345 US
- 代理机构: Goode, Ian Roy
- 优先权: US681824 20010612
- 主分类号: G01N27/90
- IPC分类号: G01N27/90
摘要:
A pulsed eddy current two-dimensional sensor array probe (12) for electrically conducting component inspection includes a drive coil (16) disposed adjacent to a structure under inspection, a pulse generator (20) connected to the drive coil (16) and operable to energize in a pulsed manner the drive coil (16) to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors (18) arranged in a two-dimensional array and substantially surrounded by the drive coil (16) and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
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