发明公开
EP1279970A3 A system for monitoring a feature of a surface with broad swath and high resolution
审中-公开
一种用于监控表面的特性具有高的分辨率和宽幅系统
- 专利标题： A system for monitoring a feature of a surface with broad swath and high resolution
- 专利标题（中）： 一种用于监控表面的特性具有高的分辨率和宽幅系统
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申请号： EP02012093.7申请日： 2002-05-31
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公开(公告)号： EP1279970A3公开(公告)日： 2004-05-26
- 发明人: Caparrini, Marco , Germain, Olivier , Soulat, Francois , Ruffini, Leonardo , Ruffini, Giulio
- 申请人： Starlab Barcelona SL
- 申请人地址： Edifici de l'Observatori Fabra, Muntanya del Tibidabo, Cami de l'Observatori s/n Barcelona ES
- 专利权人： Starlab Barcelona SL
- 当前专利权人： Starlab Barcelona SL
- 当前专利权人地址： Edifici de l'Observatori Fabra, Muntanya del Tibidabo, Cami de l'Observatori s/n Barcelona ES
- 代理机构： von Hellfeld, Axel, Dr. Dipl.-Phys.
- 优先权： US295234P 20010531
- 主分类号： G01S13/00
- IPC分类号： G01S13/00 ; G01S13/90 ; G01S13/95 ; G01C13/00
摘要：
A system for monitoring at least one feature of a surface combining Delay Doppler Complex maps obtained from a Global Navigation Satellite System component (e.g. GNSS like Galileo, GPS, Glonass and Augmentation systems, including ground pseudo-lites, or future Earth-bound or planet/space-bound navigation/positioning/communication systems) or an other satellite system indirectly from one or more receivers and/or multiple emitters and/or several observations and/or frequencies and/or polarizations and means for deriving from said reflected signals said feature to be monitored.
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