发明授权
- 专利标题: Device and system for detecting abnormality
- 专利标题(中): 装置和系统,用于检测异常
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申请号: EP02028793.4申请日: 2002-12-27
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公开(公告)号: EP1324290B1公开(公告)日: 2005-08-17
- 发明人: Ueno, Reiko , Kaneda, Noriko , Omori, Takashi , Hara, Kousuke , Yamamoto, Hiroshi , Inoue, Shigeyuki , Tanaka, Shinji
- 申请人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 申请人地址: 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 JP
- 专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人地址: 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 JP
- 代理机构: Balsters, Robert
- 优先权: JP2001392921 20011225; JP2002111292 20020412
- 主分类号: G08B21/04
- IPC分类号: G08B21/04
摘要:
An abnormality detection device 30 includes small motion sensors 25a SIMILAR 25c that detect small motions of a person in a house, a data collecting unit 32 that collects and stores sensor signals from the small motion sensors 25a SIMILAR 25c as sensor patterns, a Markov chain operating unit 33 that transforms the sensor patterns into a cluster sequence by vector-quantizing input patterns which are obtained by averaging and normalizing the sensor patterns and calculates a transition number matrix and a duration time distribution of a Markov chain and so on using a Markov chain model, a comparing unit 34 that calculates characteristic amount (Euclid distance and average log likelihood in appearance frequency of a Markov chain and average log likelihood to the duration time distribution of a Markov chain) of a sample activity as against a daily activity based on the obtained transition number matrix and the duration time distribution and so on, and others.
公开/授权文献
- EP1324290A3 Device and system for detecting abnormality 公开/授权日:2003-11-26
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