发明公开
- 专利标题: INFERENTIAL SIGNAL GENERATOR FOR INSTRUMENTED EQUIPMENT AND PROCESSES
- 专利标题(中): 推理信号发生器仪表装置和工艺
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申请号: EP01985992.5申请日: 2001-11-21
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公开(公告)号: EP1336081A2公开(公告)日: 2003-08-20
- 发明人: WEGERICH, Stephan, W.
- 申请人: Smartsignal Corporation
- 申请人地址: Suite 102, 4200 Commerce Court Lisle, IL 60532 US
- 专利权人: Smartsignal Corporation
- 当前专利权人: Smartsignal Corporation
- 当前专利权人地址: Suite 102, 4200 Commerce Court Lisle, IL 60532 US
- 代理机构: Grünecker, August, Dipl.-Ing.
- 优先权: US718592 20001122
- 国际公布: WO02042720 20020530
- 主分类号: G01D1/00
- IPC分类号: G01D1/00
摘要:
An improved system and method for producing replacement sensor signals for failed sensors (150), and inferred sensor signals (160) for non-instrumented physical parameters, in processes and equipment having one or more sensors in place for monitoring physical parameters. A data history from a fully-instrumented prototype (110) provides a representative data set of anticipated operating parameters for forming an empirical model for generating 'virtual' signals for a process or machine in real-time. A memory (551) for storing the representative training set, or a transformation thereof, is coupled to a processor (545). The processor (545) receives from an input, data signals embodying real values from sensors on the process or machine. The processor (545) takes a set of readings of the actual sensors from the input, and generates an estimate of one or more desired inferred sensors, using a linear combination of the representative training set sensor data, as weighted by the result of a measure of similarity of the input data to the representative data.
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