发明公开
- 专利标题: Charged-particle beam lens
- 专利标题(中): LinsefüreinenLadungsträgerstrahl
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申请号: EP03254334.0申请日: 2003-07-08
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公开(公告)号: EP1383158A2公开(公告)日: 2004-01-21
- 发明人: Ono, Haruhito, c/o Canon Kabushiki Kaisha , Nagae, Kenichi, Canon Kabushiki Kaisha , Takakuwa, Masaki , Nakayama, Yoshinori , Muto, Harunobu
- 申请人: CANON KABUSHIKI KAISHA , Hitachi, Ltd.
- 申请人地址: 30-2, 3-chome, Shimomaruko, Ohta-ku Tokyo JP
- 专利权人: CANON KABUSHIKI KAISHA,Hitachi, Ltd.
- 当前专利权人: CANON KABUSHIKI KAISHA,Hitachi, Ltd.
- 当前专利权人地址: 30-2, 3-chome, Shimomaruko, Ohta-ku Tokyo JP
- 代理机构: Beresford, Keith Denis Lewis
- 优先权: JP2002207292 20020716; JP2003022088 20030130
- 主分类号: H01J37/317
- IPC分类号: H01J37/317
摘要:
There is provided a multi-charged beam lens constituted by stacking, via fiber chips (212) serving as insulator members along the optical path of a charged beam, a plurality of electrodes (201a-201c) having a charged beam passing region (202) where a plurality of charged beam apertures are formed. The electrodes have shield apertures (203) between the charged beam passing region and the fiber chips. A conductive shield (204) extends through the shield apertures without contacting the electrodes, and cuts off a straight path which connects the charged beam passing region (202) and the fiber chips (212) serving as insulator members. This prevents the influence of charge-up of the insulator members on an electron beam in the multi-charged beam lens.
公开/授权文献
- EP1383158B1 Charged-particle beam lens 公开/授权日:2014-09-10
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