A method for inspecting a component (10) includes exciting a number of transducers (12) forming an array (14) to produce an ultrasonic transmission beam (beam) focused into the component. The array and the component are separated by a standoff (18). A number of echo signals are generated using the transducers, and the echo signals are processed in a number of channels. The processing includes both dynamical focus and providing a dynamic aperture (24) on receive, both of which compensate for refraction of the beam at the component/standoff interface. A single-turn inspection method includes: (a) positioning the array facing the component, (b) exciting the transducers, (c) generating a number of echo signals, (d) changing the relative angular orientation of the array and the component around an axis (26) and repeating steps (b) and (c), and (e) processing the echo signals to form at least one processed echo signal.