发明公开
- 专利标题: KOLLIMATOR FÜR SPECT-UNTERSUCHUNGEN
- 专利标题(英): Spect examination device
- 专利标题(中): 程序对SPECT研究
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申请号: EP02797567.1申请日: 2002-08-02
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公开(公告)号: EP1421411A2公开(公告)日: 2004-05-26
- 发明人: SCHRAMM, Nils , HALLING, Horst , EBEL, Gernot
- 申请人: FORSCHUNGSZENTRUM JÜLICH GMBH , Scivis GmbH, Wissenschaftliche Bildverarbeitung
- 申请人地址: 52425 Jülich DE
- 专利权人: FORSCHUNGSZENTRUM JÜLICH GMBH,Scivis GmbH, Wissenschaftliche Bildverarbeitung
- 当前专利权人: FORSCHUNGSZENTRUM JÜLICH GMBH,Scivis GmbH, Wissenschaftliche Bildverarbeitung
- 当前专利权人地址: 52425 Jülich DE
- 代理机构: Struck, Norbert, Dr.
- 优先权: DE10142421 20010831
- 国际公布: WO2003021292 20030313
- 主分类号: G01T1/00
- IPC分类号: G01T1/00
摘要:
The invention relates to a tomography device and method, particularly for single photon emission computed tomography (SPECT). The device for carrying out a tomography method, especially for carrying out a single photon tomography, comprises a multi-pinhole collimator and a detector for detecting gamma quanta or photons that penetrate the multi pinhole collimator. According to the device for carrying out the tomographic method, the distance beteween the object and the multi-pinhole collimator is selected to be smaller than the distance between the multi-pinhole collimator and the surface of the detector. The invention provides a device and a method with which the desired result can be achieved with a high spatial resolution and sensitivity.
公开/授权文献
- EP1421411B1 VERFAHREN FÜR SPECT-UNTERSUCHUNGEN 公开/授权日:2008-12-10
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